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A. Sozza, Christian Dua, Erwan Morvan, Bertrand Grimbert, V. Hoel, Sylvain L. Delage, N. Chaturvedi, Richard Lossy, Joachim Würfl. Reliability Investigation of Gallium Nitride HEMT. Microelectronics Reliability, 44(9-11):1369-1373, 2004. [doi]