Reliability Investigation of Gallium Nitride HEMT

A. Sozza, Christian Dua, Erwan Morvan, Bertrand Grimbert, V. Hoel, Sylvain L. Delage, N. Chaturvedi, Richard Lossy, Joachim Würfl. Reliability Investigation of Gallium Nitride HEMT. Microelectronics Reliability, 44(9-11):1369-1373, 2004. [doi]

Abstract

Abstract is missing.