High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study

Giovanna Sozzi, Roberto Menozzi. High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study. Microelectronics Reliability, 42(1):53-59, 2002. [doi]

Abstract

Abstract is missing.