J. van Spaandonk, Tom A. M. Kevenaar. Iterative test-point selection for analog circuits. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 66-73, IEEE Computer Society, 1996. [doi]
@inproceedings{SpaandonkK96,
title = {Iterative test-point selection for analog circuits},
author = {J. van Spaandonk and Tom A. M. Kevenaar},
year = {1996},
url = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040066abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/SpaandonkK96},
cites = {0},
citedby = {0},
pages = {66-73},
booktitle = {14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
}