Iterative test-point selection for analog circuits

J. van Spaandonk, Tom A. M. Kevenaar. Iterative test-point selection for analog circuits. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 66-73, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.