Analysis and In-Situ Measurement of Thermal-Mechanical Strain in Active Silicon Power Semiconductors - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Matthew L. Spencer, Robert D. Lorenz. Analysis and In-Situ Measurement of Thermal-Mechanical Strain in Active Silicon Power Semiconductors. In Industry Applications Society Annual Meeting, IAS 2008, Edmonton, Alberta, Canada, 5-9 Octobert, 2008. pages 1-7, IEEE, 2008. [doi]

This author has not been identified. Look up 'Matthew L. Spencer' in GoogleThis author has not been identified. Look up 'Robert D. Lorenz' in Google

runs on WebDSL