Matthew L. Spencer, Robert D. Lorenz. Analysis and In-Situ Measurement of Thermal-Mechanical Strain in Active Silicon Power Semiconductors. In Industry Applications Society Annual Meeting, IAS 2008, Edmonton, Alberta, Canada, 5-9 Octobert, 2008. pages 1-7, IEEE, 2008. [doi]
@inproceedings{SpencerL08-1,
title = {Analysis and In-Situ Measurement of Thermal-Mechanical Strain in Active Silicon Power Semiconductors},
author = {Matthew L. Spencer and Robert D. Lorenz},
year = {2008},
doi = {10.1109/08IAS.2008.360},
url = {http://dx.doi.org/10.1109/08IAS.2008.360},
researchr = {https://researchr.org/publication/SpencerL08-1},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {Industry Applications Society Annual Meeting, IAS 2008, Edmonton, Alberta, Canada, 5-9 Octobert, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2278-4},
}