Scott E. Spetka, George O. Ramseyer, Richard W. Linderman. Fault tolerant integrated information management support for physically constrained iterative deconvolution. In 37th IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2008, Washington, DC, USA, 15-17 October 2008, Proceedings. pages 1-5, IEEE Computer Society, 2008. [doi]
Abstract is missing.