Characterization of integrated semiconductor optical amplifiers in the JePPIX multi-project wafer platform

Leo Spiekman. Characterization of integrated semiconductor optical amplifiers in the JePPIX multi-project wafer platform. In 17th International Conference on Transparent Optical Networks, ICTON 2015, Budapest, Hungary, July 5-9, 2015. pages 1, IEEE, 2015. [doi]

Abstract

Abstract is missing.