Automatic Test Pattern Generation for Interconnect Open Defects

Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng. Automatic Test Pattern Generation for Interconnect Open Defects. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 181-186, IEEE Computer Society, 2008. [doi]

Abstract

Abstract is missing.