A study of the robustness of pseudorandom binary-array-based surface characterization

Hans J. W. Spoelder, Franciscus M. Vos, Emil M. Petriu, F. C. A. Croen. A study of the robustness of pseudorandom binary-array-based surface characterization. IEEE T. Instrumentation and Measurement, 47(4):833-838, 1998. [doi]

Abstract

Abstract is missing.