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An Eddy Current-Capacitive Crack Detection Probe with High Insensitivity to Lift-Off

S. Sreevatsan, Boby George, Zhichao Tan. An Eddy Current-Capacitive Crack Detection Probe with High Insensitivity to Lift-Off. In IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018. pages 4871-4876, IEEE, 2018. [doi]

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S. Sreevatsan

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Boby George

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Zhichao Tan

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