S. Sreevatsan, Boby George, Zhichao Tan. An Eddy Current-Capacitive Crack Detection Probe with High Insensitivity to Lift-Off. In IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018. pages 4871-4876, IEEE, 2018. [doi]
@inproceedings{SreevatsanGT18,
title = {An Eddy Current-Capacitive Crack Detection Probe with High Insensitivity to Lift-Off},
author = {S. Sreevatsan and Boby George and Zhichao Tan},
year = {2018},
doi = {10.1109/IECON.2018.8591254},
url = {https://doi.org/10.1109/IECON.2018.8591254},
researchr = {https://researchr.org/publication/SreevatsanGT18},
cites = {0},
citedby = {0},
pages = {4871-4876},
booktitle = {IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018},
publisher = {IEEE},
isbn = {978-1-5090-6684-1},
}