Parametric Fault Detection in Analog Circuits: A Statistical Approach - researchr publication authors

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Supriyo Srimani, Kasturi Ghosh, Hafizur Rahaman. Parametric Fault Detection in Analog Circuits: A Statistical Approach. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 275-280, IEEE Computer Society, 2016. [doi]

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