Supriyo Srimani, Kasturi Ghosh, Hafizur Rahaman. Parametric Fault Detection in Analog Circuits: A Statistical Approach. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 275-280, IEEE Computer Society, 2016. [doi]
@inproceedings{SrimaniGR16,
title = {Parametric Fault Detection in Analog Circuits: A Statistical Approach},
author = {Supriyo Srimani and Kasturi Ghosh and Hafizur Rahaman},
year = {2016},
doi = {10.1109/ATS.2016.55},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.55},
researchr = {https://researchr.org/publication/SrimaniGR16},
cites = {0},
citedby = {0},
pages = {275-280},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}