Image quality evaluation of flat panel detector binning in x-ray fluoroscopy

Yogesh Srinivas, David L. Wilson. Image quality evaluation of flat panel detector binning in x-ray fluoroscopy. In Proceedings of the 2002 IEEE International Symposium on Biomedical Imaging, Ritz-Carlton Hotel, Washington, DC, USA, 7-10 June 2002. pages 177-180, IEEE, 2002. [doi]

Authors

Yogesh Srinivas

This author has not been identified. Look up 'Yogesh Srinivas' in Google

David L. Wilson

This author has not been identified. Look up 'David L. Wilson' in Google