Yogesh Srinivas, David L. Wilson. Image quality evaluation of flat panel detector binning in x-ray fluoroscopy. In Proceedings of the 2002 IEEE International Symposium on Biomedical Imaging, Ritz-Carlton Hotel, Washington, DC, USA, 7-10 June 2002. pages 177-180, IEEE, 2002. [doi]
@inproceedings{SrinivasW02,
title = {Image quality evaluation of flat panel detector binning in x-ray fluoroscopy},
author = {Yogesh Srinivas and David L. Wilson},
year = {2002},
doi = {10.1109/ISBI.2002.1029222},
url = {http://dx.doi.org/10.1109/ISBI.2002.1029222},
researchr = {https://researchr.org/publication/SrinivasW02},
cites = {0},
citedby = {0},
pages = {177-180},
booktitle = {Proceedings of the 2002 IEEE International Symposium on Biomedical Imaging, Ritz-Carlton Hotel, Washington, DC, USA, 7-10 June 2002},
publisher = {IEEE},
}