Mixed-mode simulation approach to characterize the circuit delay sensitivity to implant dose variations

H. C. Srinivasaiah, Navakanta Bhat. Mixed-mode simulation approach to characterize the circuit delay sensitivity to implant dose variations. IEEE Trans. on CAD of Integrated Circuits and Systems, 22(6):742-747, 2003. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.