Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A. Breuer. Bounds on pseudoexhaustive test lengths. IEEE Trans. VLSI Syst., 6(3):420-431, 1998. [doi]
@article{SrinivasanGB98,
title = {Bounds on pseudoexhaustive test lengths},
author = {Rajagopalan Srinivasan and Sandeep K. Gupta and Melvin A. Breuer},
year = {1998},
doi = {10.1109/92.711313},
url = {http://doi.ieeecomputersociety.org/10.1109/92.711313},
tags = {testing},
researchr = {https://researchr.org/publication/SrinivasanGB98},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {6},
number = {3},
pages = {420-431},
}