P. Srinivasan 0002, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik. RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{SrinivasanLSHMRGCMBCGMGL23,
title = {RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications},
author = {P. Srinivasan 0002 and J. Lestage and Shafi Syed and X. Hui and Stephen Moss and Oscar D. Restrepo and Oscar H. Gonzalez and Y. Chen and T. McKay and Anirban Bandyopadhyay and Ned Cahoon and Fernando Guarin and Byoung Min and Martin Gall and S. Ludvik},
year = {2023},
doi = {10.1109/IRPS48203.2023.10118043},
url = {https://doi.org/10.1109/IRPS48203.2023.10118043},
researchr = {https://researchr.org/publication/SrinivasanLSHMRGCMBCGMGL23},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}