Suresh Srinivasan, Sanu Mathew, Vasantha Erraguntla, Ram Krishnamurthy. A 4Gbps 0.57pJ/bit Process-Voltage-Temperature Variation Tolerant All-Digital True Random Number Generator in 45nm CMOS. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009. pages 301-306, IEEE, 2009. [doi]
Abstract is missing.