Rajagopalan Srinivasan, Charles Njinda, Melvin A. Breuer. A partitioning method for achieving maximal test concurrency in pseudo-exhaustive testing. In 9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA. pages 34-39, IEEE, 1991. [doi]
Abstract is missing.