Bodapati Srinivasu, K. Sridharan. A Transistor-Level Probabilistic Approach for Reliability Analysis of Arithmetic Circuits With Applications to Emerging Technologies. IEEE Transactions on Reliability, 66(2):440-457, 2017. [doi]
@article{SrinivasuS17,
title = {A Transistor-Level Probabilistic Approach for Reliability Analysis of Arithmetic Circuits With Applications to Emerging Technologies},
author = {Bodapati Srinivasu and K. Sridharan},
year = {2017},
doi = {10.1109/TR.2016.2642168},
url = {https://doi.org/10.1109/TR.2016.2642168},
researchr = {https://researchr.org/publication/SrinivasuS17},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {66},
number = {2},
pages = {440-457},
}