P. K. Srirama, J. W. Stark, J. Zhang, Malay K. Mazumder. Non-contact Measurements of Size and Charge Distributions of Submicron Particles using an ESPART Analyzer. In Conference Record of the 2007 IEEE Industry Applications Conference Forty-Second IAS Annual Meeting, New Orleans, LA, USA, September 23-27, 2007. pages 424-426, IEEE, 2007. [doi]
Abstract is missing.