LEC Vulnerability on Constant Propagation

Sandeep Kumar Srivastav, Ming Yi Lim, Babu Trp, K. Y. Jeevan. LEC Vulnerability on Constant Propagation. In 22nd International Symposium on Quality Electronic Design, ISQED 2021, Santa Clara, CA, USA, April 7-9, 2021. pages 309, IEEE, 2021. [doi]

Authors

Sandeep Kumar Srivastav

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Ming Yi Lim

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Babu Trp

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K. Y. Jeevan

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