Sandeep Kumar Srivastav, Ming Yi Lim, Babu Trp, K. Y. Jeevan. LEC Vulnerability on Constant Propagation. In 22nd International Symposium on Quality Electronic Design, ISQED 2021, Santa Clara, CA, USA, April 7-9, 2021. pages 309, IEEE, 2021. [doi]
@inproceedings{SrivastavLTJ21,
title = {LEC Vulnerability on Constant Propagation},
author = {Sandeep Kumar Srivastav and Ming Yi Lim and Babu Trp and K. Y. Jeevan},
year = {2021},
doi = {10.1109/ISQED51717.2021.9424340},
url = {https://doi.org/10.1109/ISQED51717.2021.9424340},
researchr = {https://researchr.org/publication/SrivastavLTJ21},
cites = {0},
citedby = {0},
pages = {309},
booktitle = {22nd International Symposium on Quality Electronic Design, ISQED 2021, Santa Clara, CA, USA, April 7-9, 2021},
publisher = {IEEE},
isbn = {978-1-7281-7641-3},
}