An Automated 3D Algorithm for Neo-cortical Thickness Measurement - researchr publication authors

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Siddharth Srivastava, Frederik Maes, Dirk Vandermeulen, Patrick Dupont, Wim Van Paesschen, Paul Suetens. An Automated 3D Algorithm for Neo-cortical Thickness Measurement. In Randy E. Ellis, Terry M. Peters, editors, Medical Image Computing and Computer-Assisted Intervention - MICCAI 2003, 6th International Conference, Montréal, Canada, November 15-18, 2003, Proceedings, Part II. Volume 2879 of Lecture Notes in Computer Science, pages 488-495, Springer, 2003. [doi]

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