An Automated 3D Algorithm for Neo-cortical Thickness Measurement

Siddharth Srivastava, Frederik Maes, Dirk Vandermeulen, Patrick Dupont, Wim Van Paesschen, Paul Suetens. An Automated 3D Algorithm for Neo-cortical Thickness Measurement. In Randy E. Ellis, Terry M. Peters, editors, Medical Image Computing and Computer-Assisted Intervention - MICCAI 2003, 6th International Conference, Montréal, Canada, November 15-18, 2003, Proceedings, Part II. Volume 2879 of Lecture Notes in Computer Science, pages 488-495, Springer, 2003. [doi]

@inproceedings{SrivastavaMVDPS03,
  title = {An Automated 3D Algorithm for Neo-cortical Thickness Measurement},
  author = {Siddharth Srivastava and Frederik Maes and Dirk Vandermeulen and Patrick Dupont and Wim Van Paesschen and Paul Suetens},
  year = {2003},
  url = {http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=2879&spage=488},
  researchr = {https://researchr.org/publication/SrivastavaMVDPS03},
  cites = {0},
  citedby = {0},
  pages = {488-495},
  booktitle = {Medical Image Computing and Computer-Assisted Intervention - MICCAI 2003, 6th International Conference, Montréal, Canada, November 15-18, 2003, Proceedings, Part II},
  editor = {Randy E. Ellis and Terry M. Peters},
  volume = {2879},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-20464-4},
}