An Empirical Analysis of Backward Compatibility in Machine Learning Systems

Megha Srivastava, Besmira Nushi, Ece Kamar, Shital Shah, Eric Horvitz. An Empirical Analysis of Backward Compatibility in Machine Learning Systems. In Rajesh Gupta 0001, Yan Liu 0002, Jiliang Tang, B. Aditya Prakash, editors, KDD '20: The 26th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Virtual Event, CA, USA, August 23-27, 2020. pages 3272-3280, ACM, 2020. [doi]

Abstract

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