Ankush Srivastava, Adit D. Singh, Virendra Singh, Kewal K. Saluja. Exploiting path delay test generation to develop better TDF tests for small delay defects. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]
@inproceedings{SrivastavaSSS17-1,
title = {Exploiting path delay test generation to develop better TDF tests for small delay defects},
author = {Ankush Srivastava and Adit D. Singh and Virendra Singh and Kewal K. Saluja},
year = {2017},
doi = {10.1109/TEST.2017.8242072},
url = {https://doi.org/10.1109/TEST.2017.8242072},
researchr = {https://researchr.org/publication/SrivastavaSSS17-1},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3413-4},
}