A Dual System-Level Parameterization for Identification from Closed-Loop Data

Amber Srivastava, Mingzhou Yin, Andrea Iannelli, Roy S. Smith. A Dual System-Level Parameterization for Identification from Closed-Loop Data. In 62nd IEEE Conference on Decision and Control, CDC 2023, Singapore, December 13-15, 2023. pages 4506-4511, IEEE, 2023. [doi]

@inproceedings{SrivastavaYIS23,
  title = {A Dual System-Level Parameterization for Identification from Closed-Loop Data},
  author = {Amber Srivastava and Mingzhou Yin and Andrea Iannelli and Roy S. Smith},
  year = {2023},
  doi = {10.1109/CDC49753.2023.10383298},
  url = {https://doi.org/10.1109/CDC49753.2023.10383298},
  researchr = {https://researchr.org/publication/SrivastavaYIS23},
  cites = {0},
  citedby = {0},
  pages = {4506-4511},
  booktitle = {62nd IEEE Conference on Decision and Control, CDC 2023, Singapore, December 13-15, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-0124-3},
}