Éric St.-Pierre, Eugene Tuv. Robust, Non-Redundant Feature Selection for Yield Analysis in Semiconductor Manufacturing. In Petra Perner, editor, Advances in Data Mining. Applications and Theoretical Aspects - 11th Industrial Conference, ICDM 2011, New York, NY, USA, August 30 - September 3, 2011. Proceedings. Volume 6870 of Lecture Notes in Computer Science, pages 204-217, Springer, 2011. [doi]
Abstract is missing.