Donald Staab, Eugene R. Hnatek. Diagnosing IC Failures in a Fast Environment. IEEE Design & Test of Computers, 14(3):70-75, 1997. [doi]
@article{StaabH97:1,
title = {Diagnosing IC Failures in a Fast Environment},
author = {Donald Staab and Eugene R. Hnatek},
year = {1997},
doi = {10.1109/54.606000},
url = {http://doi.ieeecomputersociety.org/10.1109/54.606000},
tags = {meta-model, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/StaabH97%3A1},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {14},
number = {3},
pages = {70-75},
}