Nick J. S. Stacy, David J. Crisp, Alvin S. Goh, Daniel Badger, Mark Preiss. Polarimetric analysis of fine resolution X-band SAR sea clutter data. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2005, July 25-29, 2005, Seoul, Korea, Proceedings. pages 2787-2790, IEEE, 2005. [doi]
Abstract is missing.