Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Wolfgang Stadler, K. Esmark, K. Reynders, M. Zubeidat, M. Graf, Wolfgang Wilkening, J. Willemen, N. Qu, S. Mettler, M. Etherton. Test circuits for fast and reliable assessment of CDM robustness of I/O stages. Microelectronics Reliability, 45(2):269-277, 2005. [doi]

Abstract

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