Christina Stadler, Xenia Flamm, Thomas Gruber, Anatoli Djanatliev, Reinhard German, David Eckhoff. A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing. In 2017 IEEE Vehicular Networking Conference, VNC 2017, Torino, Italy, November 27-29, 2017. pages 195-202, IEEE, 2017. [doi]
@inproceedings{StadlerFGDGE17,
title = {A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing},
author = {Christina Stadler and Xenia Flamm and Thomas Gruber and Anatoli Djanatliev and Reinhard German and David Eckhoff},
year = {2017},
doi = {10.1109/VNC.2017.8275597},
url = {https://doi.org/10.1109/VNC.2017.8275597},
researchr = {https://researchr.org/publication/StadlerFGDGE17},
cites = {0},
citedby = {0},
pages = {195-202},
booktitle = {2017 IEEE Vehicular Networking Conference, VNC 2017, Torino, Italy, November 27-29, 2017},
publisher = {IEEE},
isbn = {978-1-5386-0986-6},
}