Dimitrios Stamoulis, Simone Corbetta, Dimitrios Rodopoulos, Pieter Weckx, Peter Debacker, Brett H. Meyer, Ben Kaczer, Praveen Raghavan, Dimitrios Soudris, Francky Catthoor, Zeljko Zilic. Capturing True Workload Dependency of BTI-induced Degradation in CPU Components. In Ayse Kivilcim Coskun, Martin Margala, Laleh Behjat, Jie Han, editors, Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016. pages 373-376, ACM, 2016. [doi]
@inproceedings{StamoulisCRWDMK16,
title = {Capturing True Workload Dependency of BTI-induced Degradation in CPU Components},
author = {Dimitrios Stamoulis and Simone Corbetta and Dimitrios Rodopoulos and Pieter Weckx and Peter Debacker and Brett H. Meyer and Ben Kaczer and Praveen Raghavan and Dimitrios Soudris and Francky Catthoor and Zeljko Zilic},
year = {2016},
doi = {10.1145/2902961.2902992},
url = {http://doi.acm.org/10.1145/2902961.2902992},
researchr = {https://researchr.org/publication/StamoulisCRWDMK16},
cites = {0},
citedby = {0},
pages = {373-376},
booktitle = {Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016},
editor = {Ayse Kivilcim Coskun and Martin Margala and Laleh Behjat and Jie Han},
publisher = {ACM},
isbn = {978-1-4503-4274-2},
}