Dimitrios Stamoulis, Simone Corbetta, Dimitrios Rodopoulos, Pieter Weckx, Peter Debacker, Brett H. Meyer, Ben Kaczer, Praveen Raghavan, Dimitrios Soudris, Francky Catthoor, Zeljko Zilic. Capturing True Workload Dependency of BTI-induced Degradation in CPU Components. In Ayse Kivilcim Coskun, Martin Margala, Laleh Behjat, Jie Han, editors, Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016. pages 373-376, ACM, 2016. [doi]
Abstract is missing.