Efficient Reliability Analysis of Processor Datapath using Atomistic BTI Variability Models - researchr publication authors

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Dimitrios Stamoulis, Dimitrios Rodopoulos, Brett H. Meyer, Dimitrios Soudris, Francky Catthoor, Zeljko Zilic. Efficient Reliability Analysis of Processor Datapath using Atomistic BTI Variability Models. In Alex K. Jones, Hai Helen Li, Ayse Kivilcim Coskun, Martin Margala, editors, Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20 - 22, 2015. pages 57-62, ACM, 2015. [doi]

This author has not been identified. Look up 'Dimitrios Stamoulis' in GoogleThis author has not been identified. Look up 'Dimitrios Rodopoulos' in GoogleThis author has not been identified. Look up 'Brett H. Meyer' in GoogleThis author has not been identified. Look up 'Dimitrios Soudris' in GoogleThis author has not been identified. It may be one of the following persons:

Francky Catthoor

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