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Process Metrics Are Not Bad Predictors of Fault Proneness

Biljana Stanic, Wasif Afzal. Process Metrics Are Not Bad Predictors of Fault Proneness. In 2017 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2017, Prague, Czech Republic, July 25-29, 2017. pages 493-499, IEEE, 2017. [doi]

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Biljana Stanic

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Wasif Afzal

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