Biljana Stanic, Wasif Afzal. Process Metrics Are Not Bad Predictors of Fault Proneness. In 2017 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2017, Prague, Czech Republic, July 25-29, 2017. pages 493-499, IEEE, 2017. [doi]
@inproceedings{StanicA17, title = {Process Metrics Are Not Bad Predictors of Fault Proneness}, author = {Biljana Stanic and Wasif Afzal}, year = {2017}, doi = {10.1109/QRS-C.2017.85}, url = {https://doi.org/10.1109/QRS-C.2017.85}, researchr = {https://researchr.org/publication/StanicA17}, cites = {0}, citedby = {0}, pages = {493-499}, booktitle = {2017 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2017, Prague, Czech Republic, July 25-29, 2017}, publisher = {IEEE}, isbn = {978-1-5386-2072-4}, }