Multiple fault diagnosis of analog circuits by locating ambiguity groups of test equation

Janusz A. Starzyk, D. Liu. Multiple fault diagnosis of analog circuits by locating ambiguity groups of test equation. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 199-202, IEEE, 2001. [doi]

Abstract

Abstract is missing.