Deep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on apples

Nikita Stasenko, Elizaveta Chernova, Dmitrii Shadrin, George Ovchinnikov, Ivan Krivolapov, Mariia Pukalchik. Deep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on apples. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2021, Glasgow, United Kingdom, May 17-20, 2021. pages 1-6, IEEE, 2021. [doi]

Abstract

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