James H. Stathis, S. Zafar. The negative bias temperature instability in MOS devices: A review. Microelectronics Reliability, 46(2-4):270-286, 2006. [doi]
@article{StathisZ06,
title = {The negative bias temperature instability in MOS devices: A review},
author = {James H. Stathis and S. Zafar},
year = {2006},
doi = {10.1016/j.microrel.2005.08.001},
url = {http://dx.doi.org/10.1016/j.microrel.2005.08.001},
tags = {reviewing},
researchr = {https://researchr.org/publication/StathisZ06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {2-4},
pages = {270-286},
}