Special session on BIST/calibration of A/MS devices

Hans-Mart von Staudt, James Izon, Sule Ozev, Peter Sarson. Special session on BIST/calibration of A/MS devices. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1, IEEE Computer Society, 2018. [doi]

Authors

Hans-Mart von Staudt

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James Izon

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Sule Ozev

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Peter Sarson

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