Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces

Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim. Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. In 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021. pages 1-10, IEEE, 2021. [doi]

Authors

Hans Martin von Staudt

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Bradford G. Van Treuren

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Jeff Rearick

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Michele Portolan

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Martin Keim

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