Table of Contents

• Compact Protection Codes for protecting memory from malicious data and address manipulationsGilad Dar, Avihay Grigiac, David Peled, Yagel Ashkenazi, Menachem Goldzweig, Yoav Weizman, Osnat Keren. 1-6 [doi]
• Test Data-Driven Machine Learning Models for Reliable Quantum Circuit OutputVedika Saravanan, Samah Mohamed Saeed. 1-6 [doi]
• Security, Reliability and Test Aspects of the RISC-V EcosystemJaume Abella 0001, Sergi Alcaide, Jens Anders, Francisco Bas, Steffen Becker 0001, Elke De Mulder, Nourhan Elhamawy, Frank K. Gürkaynak, Helena Handschuh, Carles Hernández, Mike Hutter, Leonidas Kosmidis, Ilia Polian, Matthias Sauer 0002, Stefan Wagner 0001, Francesco Regazzoni 0001. 1-10 [doi]
• Trustworthy computing on untrustworthy and Trojan-infected on-chip interconnectsHeba Salem, Nigel Topham. 1-2 [doi]
• Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop MonitoringKazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen. 1-4 [doi]
• A Plug and Play Digital ABIST Controller for Analog Sensors in Secure DevicesS. Lapeyre, Nicolas Valette, Marc Merandat, Marie-Lise Flottes, Bruno Rouzeyre, Arnaud Virazel. 1-4 [doi]
• Recent Advances in Photonic Physical Unclonable FunctionsFabio Pavanello, Ian O'Connor, Ulrich Rührmair, Amy C. Foster, Dimitris Syvridis. 1-10 [doi]
• Unsupervised Learning in Test Generation for Digital Integrated CircuitsSoham Roy, Spencer K. Millican, Vishwani D. Agrawal. 1-4 [doi]
• GPU-based ATPG System by Scaling Memory Usage and Reducing Data TransferHua-Ren Li, Hsing-Chung Liang. 1-2 [doi]
• BIST-Assisted Analog Fault DiagnosisAntonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos. 1-6 [doi]
• ESD-PCM: Constructing Reliable Super Dense Phase Change Memory Under Write DisturbanceWenke Jin, Siqi Lu, Xiaojun Cai. 1-6 [doi]
• Chill Out: Freezing Attacks on Capacitors and DC/DC ConvertersObi Nnorom, Jalil Morris, Ilias Giechaskiel, Jakub Szefer. 1-2 [doi]
• Online Testing of a Row-Stationary Convolution AcceleratorMohammad Rasoul Roshanshah, Katayoon Basharkhah, Zainalabedin Navabi. 1-2 [doi]
• Applying IEEE Std 1838 to the 3DIC Design Trishul - A Case StudyTeresa L. McLaurin, Frank Frederick, Heath Perry, Shawn Hung, Saurabh Sinha. 1-4 [doi]
• Hierarchical Fault Simulation of Deep Neural Networks on Multi-Core SystemsMasoomeh Karami, Mohammad Hashem Haghbayan, Masoumeh Ebrahimi, Antonio Miele, Hannu Tenhunen, Juha Plosila. 1-2 [doi]
• An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case StudyIsaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen. 1-4 [doi]
• SafeSU: an Extended Statistics Unit for Multicore Timing InterferenceGuillem Cabo, Francisco Bas, Ruben Lorenzo, David Trilla, Sergi Alcaide, Miquel Moretó, Carles Hernández, Jaume Abella 0001. 1-4 [doi]
• ArsoNISQ: Analyzing Quantum Algorithms on Near-Term ArchitecturesSebastian Brandhofer, Simon J. Devitt, Ilia Polian. 1-6 [doi]
• Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural AnalysisFrancesco Lorenzelli, Zhan Gao, Joe Swenton, Santosh Malagi, Erik Jan Marinissen. 1-6 [doi]
• Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular AutomataSyed Farah Naz, Ambika Prasad Shah, Suhaib Ahmed, Patrick Girard 0001, Michael Waltl. 1-2 [doi]
• Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMsG. Cardoso Medeiros, Moritz Fieback, A. Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui. 1-6 [doi]
• Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuliThibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre. 1-6 [doi]
• Opacity preserving Countermeasure using Finite State Machines against Differential Scan AttacksSk Subidh Ali, Yogendra Sao, Santosh Biswas. 1-2 [doi]
• Intermittent Undefined State Fault in RRAMsMoritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui. 1-6 [doi]
• *Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jürgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique 0001, Said Hamdioui, Bastien Deveautour, Patrick Girard 0001, Arnaud Virazel, Koen Bertels. 1-10 [doi]
• Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellationAnkush Mamgain, Manuel J. Barragan, Salvador Mir. 1-6 [doi]
• A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuitChangming Cui, Junlin Huang. 1-2 [doi]
• Run Time Management of Faulty Data CachesMichail Mavropoulos, Georgios Keramidas, Dimitris Nikolos. 1-6 [doi]
• A Survey and Tutorial on Security and Resilience of Quantum ComputingAbdullah Ash-Saki, Mahabubul Alam, Koustubh Phalak, Aakarshitha Suresh, Rasit Onur Topaloglu, Swaroop Ghosh. 1-10 [doi]
• MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAMChristopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori. 1-6 [doi]
• RHAT: Efficient RowHammer-Aware Test for Modern DRAM ModulesMohammad Farmani, Mark Mohammad Tehranipoor, Fahim Rahman. 1-6 [doi]
• Analyzing the Impact of Approximate Adders on the Reliability of FPGA AcceleratorsIoannis Tsounis, Athanasios Papadimitriou, Mihalis Psarakis. 1-2 [doi]
• Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP InterfacesHans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim. 1-10 [doi]
• A Tutorial of How to Ensure High Automotive Microcontroller QualityRalf Arnold. 1-2 [doi]
• Designing Recurrent Neural Networks for Monitoring Embedded DevicesFin Hendrik Bahnsen, Jan Kaiser, Görschwin Fey. 1-4 [doi]
• Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised ClusteringKatherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Nova Cheng-Yen Tsai, Leon Chou, Gus Chang-Hung Han, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu. 1-2 [doi]
• Transit-Guard: An OS-based Defense Mechanism Against Transient Execution AttacksMaria Mushtaq, David Novo, Florent Bruguier, Pascal Benoit, Muhammad Khurram Bhatti. 1-2 [doi]
• Arithmetic Circuit Correction by Adding Optimized Correctors Based on Groebner Basis ComputationNegar Aghapour Sabbagh, Bijan Alizadeh. 1-6 [doi]
• System-Level Access to On-Chip InstrumentsErik Larsson, Shashi Kiran Gangaraju, Prathamesh Murali. 1-6 [doi]
• TDMS Test Scheduler: An Integrated Framework for Test Scheduling of DVFS-based SoCs with Multiple Voltage IslandsFotios Vartziotis. 1-2 [doi]
• Convolutional Compaction-Based MRAM Fault DiagnosisBartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer. 1-6 [doi]
• Exploiting Active Learning for Microcontroller Performance PredictionNicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero. 1-4 [doi]
• NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive MemoriesSoyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori. 1-6 [doi]
• Synergies Between Delay Test and Post-silicon Speed Path Validation: A Tutorial IntroductionSandip Ray, Arani Sinha. 1-4 [doi]