Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori. MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. In 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.