Wilfried Steiner, Ayhan Mehmed, Sasikumar Punnekkat. Improving Intelligent Vehicle Dependability by Means of Infrastructure-Induced Tests. In IEEE International Conference on Dependable Systems and Networks Workshops, DSN Workshops 2015, Rio de Janeiro, Brazil, June 22-25, 2015. pages 147-152, IEEE, 2015. [doi]
Abstract is missing.