Phil Steinhorst, Christof Duhme, Xiaoyi Jiang 0001, Jan Vahrenhold. Recognizing Patterns in Productive Failure. In Ben Stephenson, Jeffrey A. Stone, Lina Battestilli, Samuel A. Rebelsky, Libby Shoop, editors, Proceedings of the 55th ACM Technical Symposium on Computer Science Education, SIGCSE 2024, Volume 1, Portland, OR, USA, March 20-23, 2024. pages 1293-1299, ACM, 2024. [doi]
Abstract is missing.